Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 4070

003 - CONTROL NUMBER IDENTIFIER

• control field: DLC

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20230328121455.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 890519i| anannbab| |a ana |||

010 ## - LIBRARY OF CONGRESS CONTROL NUMBER

• LC control number: sh 89003063

040 ## - CATALOGING SOURCE

• Original cataloging agency: DLC
• Transcribing agency: DLC

150 #0 - HEADING--TOPICAL TERM

• Topical term or geographic name entry element: Silicon-on-insulator technology.

450 #0 - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: SOI devices

550 #0 - SEE ALSO FROM TRACING--TOPICAL TERM

• Control subfield: g
• Topical term or geographic name entry element: Electric insulators and insulation

550 #0 - SEE ALSO FROM TRACING--TOPICAL TERM

• Control subfield: g
• Topical term or geographic name entry element: Semiconductors

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: Silicon-on-insulator: a categorized bibliography, including abstracts, 1987.

670 ## - SOURCE DATA FOUND

• Source citation: ASTI:
• Information found: p. 1960, under Silicon-on-insulator devices.

670 ## - SOURCE DATA FOUND

• Source citation: EI:
• Information found: v. 86, part IX, p. 6460-61, under Silicon-on-insulator circuits, devices, films, (SOI) materials, structures, substrates, systems, and technology.

670 ## - SOURCE DATA FOUND

• Source citation: Encyc. of physical sci. & tech.:
• Information found: p. 999.

675 ## - SOURCE DATA NOT FOUND

• Source citation: Chem. abst.;
• Source citation: Hennepin;
• Source citation: IAC;
• Source citation: INSPEC thes.;
• Source citation: Random House;
• Source citation: Web. 3